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१९९८ का प्रकाशन |
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तत्व |
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J. Lösch, P. Leinenbach, U. Memmert, and U. Hartmann |
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MORPHOLOGY OF Ag(100) SUBSTRATES: THE INFLUENCE OF THE FILM THICHNESS
AND THE ANNEALING
PROCESSES STUDIED BY SCANNING TUNNELING MICROSCOPY |
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Proc.
STM´97 Conf., Hamburg, Germany, 1997; Appl. Phys. A 66, S1133
(1998) |
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E.M. Siebel, U. Memmert, R. Vogel, and U. Hartmann |
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IN SITU OBSERVATION OF ELECTROCHEMICAL Cu DEPOSITION BY
SCANNING FORCE MICROSCOPY |
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Proc. STM´97 Conf., Hamburg, Germany, 1997; Appl. Phys. A 66,
S83 (1998) |
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M. Niedereichholz, H. Gao, M. Oberringer, H. P. Sattler, W.
Mutschler, U. Hartmann, R. G. Hanselmann |
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SCANNING NEAR FIELD OPTICAL MICROSCOPY (SNOM) AND ATOMIC
FORCE MICROSCOPY (AFM): NEW TOOLS FOR THE MEDICAL AND BIOLOGICAL RESEARCH |
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Langenbeck Archives of Surgery 383, 5 (1998) |
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C. Horstmann, P. Leinenbach, A. Engelhardt, R. Gerber, J. L. Jia,
R. Dittmann, U. Memmert, U. Hartmann und A.I. Braginski |
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INFLUENCE OF RAMP SHAPE AND MORPHOLOGY ON THE PROPERTIES
OF YBa2Cu3O7-d RAMP-TYPE JUNCTIONS |
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Physica C 302, 176 (1998) |
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