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Scanning force microscopy as the most widely used
variant of the scanning probe methods exhibited a strikingly successful
evolution over the past ten years. Today force microscopy and related
methods are used in experimental physics, in chemistry, in materials
science and in biology. While the basic modes of operation are
well-established and are available as commercial solutions, some highly
dedicated modes of operation are permanently under development. Thus,
the situation is that the number of publications dealing with force
microscopy and its applications in various research areas is still
considerably growing. In such a situation it is certainly very helpful,
even for the expert in the field, to consult from time to time adequate
overviews presenting the actual state of the art. The present overview
is by far not exhaustive. It may be helpful for the operator of a
scanning probe microscope who is interested in getting some information
on inner parts of the black box which he is hopefully successfully
employing for his research. The article may also be helpful for those
colleagues who entered the field of scanning probe methods in order to
concentrate their efforts on the understanding of still not
well-understood probe-sample interactions taking place upon operating
scanning probe instruments and on the improvement of the methods.
Finally, even the real expert may not waste time in reading the article
because it provides him at least with historically important references
and with key references as a link to more dedicated highly sophisticated
publications. Thus, the choice of papers cited in the following should
be considered as an attempt to mention the most important preliminary
approaches on the one hand and to provide links to at least some of the
many interesting and striking applications on the other hand. |
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