摘要

Scanning force microscopy as the most widely used variant of the scanning probe methods exhibited a strikingly successful evolution over the past ten years. Today force microscopy and related methods are used in experimental physics, in chemistry, in materials science and in biology. While the basic modes of operation are well-established and are available as commercial solutions, some highly dedicated modes of operation are permanently under development. Thus, the situation is that the number of publications dealing with force microscopy and its applications in various research areas is still considerably growing. In such a situation it is certainly very helpful, even for the expert in the field, to consult from time to time adequate overviews presenting the actual state of the art. The present overview is by far not exhaustive. It may be helpful for the operator of a scanning probe microscope who is interested in getting some information on inner parts of the black box which he is hopefully successfully employing for his research. The article may also be helpful for those colleagues who entered the field of scanning probe methods in order to concentrate their efforts on the understanding of still not well-understood probe-sample interactions taking place upon operating scanning probe instruments and on the improvement of the methods. Finally, even the real expert may not waste time in reading the article because it provides him at least with historically important references and with key references as a link to more dedicated highly sophisticated publications. Thus, the choice of papers cited in the following should be considered as an attempt to mention the most important preliminary approaches on the one hand and to provide links to at least some of the many interesting and striking applications on the other hand.